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Hitachi S-3400 Varible Pressure Scanning Electron Microscope
eagle-i ID
http://xula.eagle-i.net/i/00000139-26ee-c2c0-8dd7-9ade80000000
Resource Type
Properties
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Resource Description
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"The S-3400N is a powerful, yet user-friendly SEM with sophisticated electron optical and automated functions, including Auto Beam Setting with Auto Axial Alignment. These are complemented by simple switching between variable pressure, high-vacuum and low-voltage modes with a single button press The novel "Quad-Bias" facility offers significantly higher probe currents for superior imaging even at low accelerating voltages, below 3 kV. This protects samples from beam damage and guarantees detailed surface imaging. Optimized detector technology such as the patented Environmental Secondary Electron Detector (ESED II) and innovative 4+1-Segment-BSE-detector provide maximum information from every sample. Variable chamber pressure allows charge up-free observation of any sample without special preparation techniques such as coating. The analytical specimen chamber design has optimum geometry for simultaneous accommodation of EDS, WDS and EBSD. The S-3400N features a 5-axis motorized stage with high tilt (-20° to +90°) which can accommodate samples up to 200 mm in diameter and up to 80mm high."
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Additional Name
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Variable pressure analytical field emission scanning electron microscope
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Contact
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Mandal, Tarun, Ph.D.
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Manufacturer
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Hitachi, Ltd.
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Model Number
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S-3400
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Website(s)
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http://www.hitachi-hta.com/products/electron-microscopes-and-focused-ion-beam/standard-and-variable-pressure-sem/s-3400n-fully-
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Location
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Center for Nanomedicine & Drug Delivery (CNMDD)