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Hitachi S-3400 Varible Pressure Scanning Electron Microscope

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Resource Type

  1. Variable pressure analytical field emission scanning electron microscope


  1. Resource Description
    "The S-3400N is a powerful, yet user-friendly SEM with sophisticated electron optical and automated functions, including Auto Beam Setting with Auto Axial Alignment. These are complemented by simple switching between variable pressure, high-vacuum and low-voltage modes with a single button press The novel "Quad-Bias" facility offers significantly higher probe currents for superior imaging even at low accelerating voltages, below 3 kV. This protects samples from beam damage and guarantees detailed surface imaging. Optimized detector technology such as the patented Environmental Secondary Electron Detector (ESED II) and innovative 4+1-Segment-BSE-detector provide maximum information from every sample. Variable chamber pressure allows charge up-free observation of any sample without special preparation techniques such as coating. The analytical specimen chamber design has optimum geometry for simultaneous accommodation of EDS, WDS and EBSD. The S-3400N features a 5-axis motorized stage with high tilt (-20° to +90°) which can accommodate samples up to 200 mm in diameter and up to 80mm high."
  2. Additional Name
    Variable pressure analytical field emission scanning electron microscope
  3. Contact
    Mandal, Tarun, Ph.D.
  4. Manufacturer
    Hitachi, Ltd.
  5. Model Number
  6. Website(s)
  7. Location
    Center for Nanomedicine & Drug Delivery (CNMDD)
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